OXIDE RELIABILITY (V23) A Summary of Silicon Oxide Wearout, Breakdown, and Reliability – PDF/EPUB Version Downloadable

$49.99

Author(s): Dumin David J
Publisher: World Scientific
ISBN: 9789810248420
Edition:

Important: No Access Code

Delivery: This can be downloaded Immediately after purchasing.

Version: Only PDF Version.

Compatible Devices: Can be read on any device (Kindle, NOOK, Android/IOS devices, Windows, MAC)

Quality: High Quality. No missing contents. Printable

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Description

This book presents in summary the state of our knowledge of oxide reliability. The articles have been written by experts who are among the most knowledgeable in the field. The book will be an invaluable aid to reliability engineers and manufacturing engineers, helping them to produce and characterize reliable oxides. It can be used as an introduction for new engineers interested in oxide reliability, besides being a reference for engineers already engaged in the field.