Materials Science in Microelectronics I: The Relationships Between Thin Film Processing & Structure 2nd Edition – PDF/EPUB Version Downloadable

$49.99

Author(s): Machlin, Eugene
Publisher: Elsevier Science
ISBN: 9780080446400
Edition: 2nd Edition

Important: No Access Code

Delivery: This can be downloaded Immediately after purchasing.

Version: Only PDF Version.

Compatible Devices: Can be read on any device (Kindle, NOOK, Android/IOS devices, Windows, MAC)

Quality: High Quality. No missing contents. Printable

Recommended Software: Check here

Description

Thin films play a key role in the material science of microelectronics, and the subject matter of thin-films divides naturally into two headings: processing / structure relationship, and structure / properties relationship.

The first volume of Materials Science in Microelectronics focuses on the first relationship – that between processing and the structure of the thin-film. The state of the thin film’s surface during the period that one monolayer exists – before being buried in the next layer – determines the ultimate structure of the thin film, and thus its properties. This volume takes into consideration the following potential influencing factors: crystal defects, void structure, grain structure, interface structure in epitaxial films, the structure of amorphous films, and reaction-induced structure.

An ideal text or reference work for students and researchers in material science, who need to learn the basics of thin films.